Invited Review Article: Microwave spectroscopy based on scanning thermal microscopy: Resolution in the nanometer range

Published 2008 View Full Article

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Title
Invited Review Article: Microwave spectroscopy based on scanning thermal microscopy: Resolution in the nanometer range
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 79, Issue 4, Pages 041101
Publisher
AIP Publishing
Online
2008-04-25
DOI
10.1063/1.2908445

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