Thermal conductivity measurement and interface thermal resistance estimation using SiO2 thin film

Published 2008 View Full Article

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Title
Thermal conductivity measurement and interface thermal resistance estimation using SiO2 thin film
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 79, Issue 5, Pages 054902
Publisher
AIP Publishing
Online
2008-05-28
DOI
10.1063/1.2927253

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