Simulating and interpreting Kelvin probe force microscopy images on dielectrics with boundary integral equations

Published 2008 View Full Article

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Title
Simulating and interpreting Kelvin probe force microscopy images on dielectrics with boundary integral equations
Authors
Keywords
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Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 79, Issue 2, Pages 023711
Publisher
AIP Publishing
Online
2008-02-29
DOI
10.1063/1.2885679

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