Improved conductive atomic force microscopy measurements on organic photovoltaic materials via mitigation of contact area uncertainty

Title
Improved conductive atomic force microscopy measurements on organic photovoltaic materials via mitigation of contact area uncertainty
Authors
Keywords
-
Journal
PROGRESS IN PHOTOVOLTAICS
Volume 21, Issue 7, Pages 1433-1443
Publisher
Wiley
Online
2012-06-14
DOI
10.1002/pip.2217

Ask authors/readers for more resources

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started