Edge dislocation slows down oxide ion diffusion in doped CeO2 by segregation of charged defects

Title
Edge dislocation slows down oxide ion diffusion in doped CeO2 by segregation of charged defects
Authors
Keywords
-
Journal
Nature Communications
Volume 6, Issue 1, Pages -
Publisher
Springer Nature
Online
2015-02-27
DOI
10.1038/ncomms7294

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