Edge dislocation slows down oxide ion diffusion in doped CeO2 by segregation of charged defects
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Title
Edge dislocation slows down oxide ion diffusion in doped CeO2 by segregation of charged defects
Authors
Keywords
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Journal
Nature Communications
Volume 6, Issue 1, Pages -
Publisher
Springer Nature
Online
2015-02-27
DOI
10.1038/ncomms7294
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