Journal
POWDER DIFFRACTION
Volume 26, Issue 1, Pages 88-93Publisher
CAMBRIDGE UNIV PRESS
DOI: 10.1154/1.3548128
Keywords
Rietveld; instrument profile; profile function; convolution
Ask authors/readers for more resources
GSAS instrument parameters are tabulated for a variety of laboratory and synchrotron diffractometers to give users an idea of the typical ranges of profile parameters when they generate their own instrument parameter files. For modern high-resolution laboratory diffractometers, the parameters fall in the ranges 0<3, V=0, 0<4. 1<3. 0<3, 1<3, and 0
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available