XRD total pattern fitting applied to study of microstructure of TiO2 films

Published 2010 View Full Article

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Title
XRD total pattern fitting applied to study of microstructure of TiO2 films
Authors
Keywords
-
Journal
POWDER DIFFRACTION
Volume 25, Issue 02, Pages 125-131
Publisher
Cambridge University Press (CUP)
Online
2010-05-29
DOI
10.1154/1.3392371
References
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