Grain growth in nanocrystalline copper thin films investigated by non-ambient X-ray diffraction measurements

Published 2009 View Full Article

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Title
Grain growth in nanocrystalline copper thin films investigated by non-ambient X-ray diffraction measurements
Authors
Keywords
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Journal
POWDER DIFFRACTION
Volume 24, Issue 2, Pages 85
Publisher
Cambridge University Press (CUP)
Online
2009-08-14
DOI
10.1154/1.3125550
References
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