Journal
PHYSICS LETTERS A
Volume 372, Issue 21, Pages 3914-3918Publisher
ELSEVIER
DOI: 10.1016/j.physleta.2008.02.064
Keywords
diamond; boron; XPS; Raman spectra
Categories
Ask authors/readers for more resources
For the first time investigations of the boron distribution in the subsurface region of HPHT boron-doped diamond that is promising for applications in electronics were carried out by X-ray photoelectron (XPS) and Raman spectroscopy. It was found from XPS data that the boron content decreased gradually more than one order of magnitude in depth of surface. The first-principle calculations have shown that the Raman polarizability in the crossed polarization configuration should increase considerably with boron doping. The Raman spectra from as-grown and polished surfaces of heavily boron-doped diamond are discussed in the context of theoretical results. (c) 2008 Elsevier B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available