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Title
Conductivity of Si(111)-(7×7): The Role of a Single Atomic Step
Authors
Keywords
-
Journal
PHYSICAL REVIEW LETTERS
Volume 112, Issue 24, Pages -
Publisher
American Physical Society (APS)
Online
2014-06-19
DOI
10.1103/physrevlett.112.246802
References
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Related references
Note: Only part of the references are listed.- Four-probe measurements with a three-probe scanning tunneling microscope
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- Spectroscopy of few-electron single-crystal silicon quantum dots
- (2010) Martin Fuechsle et al. Nature Nanotechnology
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- (2009) George Kirczenow et al. PHYSICAL REVIEW B
- Conductivity of theSi(111)7×7dangling-bond state
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- (2008) Philipp Jaschinsky et al. JOURNAL OF APPLIED PHYSICS
- Theoretical Study of Work Function Modification by Organic Molecule-Derived Linear Nanostructure on H−Silicon(100)-2 × 1
- (2008) Amsalu Y. Anagaw et al. Journal of Physical Chemistry C
- Surface-sensitive conductance measurements
- (2008) Ph Hofmann et al. JOURNAL OF PHYSICS-CONDENSED MATTER
- Surface-sensitive conductance measurements on clean and stepped semiconductor surfaces: Numerical simulations of four point probe measurements
- (2008) J.W. Wells et al. SURFACE SCIENCE
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