Robust Formation of Skyrmions and Topological Hall Effect Anomaly in Epitaxial Thin Films of MnSi
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Title
Robust Formation of Skyrmions and Topological Hall Effect Anomaly in Epitaxial Thin Films of MnSi
Authors
Keywords
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Journal
PHYSICAL REVIEW LETTERS
Volume 110, Issue 11, Pages -
Publisher
American Physical Society (APS)
Online
2013-03-13
DOI
10.1103/physrevlett.110.117202
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