Robust Formation of Skyrmions and Topological Hall Effect Anomaly in Epitaxial Thin Films of MnSi

Title
Robust Formation of Skyrmions and Topological Hall Effect Anomaly in Epitaxial Thin Films of MnSi
Authors
Keywords
-
Journal
PHYSICAL REVIEW LETTERS
Volume 110, Issue 11, Pages -
Publisher
American Physical Society (APS)
Online
2013-03-13
DOI
10.1103/physrevlett.110.117202

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