Core-Level Spectroscopy of Point Defects in Single Layerh-BN

Single atom spectroscopy with reduced delocalization effect using a 30 kV-STEM

(2011) K. Suenaga et al.   EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS

Experimental analysis of charge redistribution due to chemical bonding by high-resolution transmission electron microscopy

(2011) Jannik C. Meyer et al.   NATURE MATERIALS

Identification of active atomic defects in a monolayered tungsten disulphide nanoribbon

(2011) Zheng Liu et al.   Nature Communications

Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun

(2010) T. Sasaki et al.   Microscopy

Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy

(2010) Ondrej L. Krivanek et al.   NATURE

Atom-by-atom spectroscopy at graphene edge

(2010) Kazu Suenaga et al.   NATURE

Electron knock-on damage in hexagonal boron nitride monolayers

(2010) J. Kotakoski et al.   PHYSICAL REVIEW B

Selective Sputtering and Atomic Resolution Imaging of Atomically Thin Boron Nitride Membranes

(2009) Jannik C. Meyer et al.   NANO LETTERS

Atomically thin hexagonal boron nitride probed by ultrahigh-resolution transmission electron microscopy

(2009) Nasim Alem et al.   PHYSICAL REVIEW B

Fabrication of a Freestanding Boron Nitride Single Layer and Its Defect Assignments

(2009) Chuanhong Jin et al.   PHYSICAL REVIEW LETTERS

Graphene at the Edge: Stability and Dynamics

(2009) C. O. Girit et al.   SCIENCE

The two-dimensional phase of boron nitride: Few-atomic-layer sheets and suspended membranes

(2008) D. Pacilé et al.   APPLIED PHYSICS LETTERS

Direct Imaging of Lattice Atoms and Topological Defects in Graphene Membranes

(2008) Jannik C. Meyer et al.   NANO LETTERS