Dependence of Band-Renormalization Effects on the Number of Copper Oxide Layers in Tl-Based Copper Oxide Superconductors Revealed by Angle-Resolved Photoemission Spectroscopy

Title
Dependence of Band-Renormalization Effects on the Number of Copper Oxide Layers in Tl-Based Copper Oxide Superconductors Revealed by Angle-Resolved Photoemission Spectroscopy
Authors
Keywords
-
Journal
PHYSICAL REVIEW LETTERS
Volume 103, Issue 6, Pages -
Publisher
American Physical Society (APS)
Online
2009-08-04
DOI
10.1103/physrevlett.103.067003

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