Wavelength and Intensity Dependence of Short Pulse Laser Xenon Double Ionization between 500 and 2300 nm

Published 2009 View Full Article

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Title
Wavelength and Intensity Dependence of Short Pulse Laser Xenon Double Ionization between 500 and 2300 nm
Authors
Keywords
-
Journal
PHYSICAL REVIEW LETTERS
Volume 103, Issue 17, Pages -
Publisher
American Physical Society (APS)
Online
2009-10-23
DOI
10.1103/physrevlett.103.173001
References
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