4.7 Article

Investigation of film surface roughness and porosity dependence on lattice size in a porous thin film deposition process

Journal

PHYSICAL REVIEW E
Volume 80, Issue 4, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevE.80.041122

Keywords

Monte Carlo methods; partial differential equations; porosity; stochastic processes; surface roughness; thin films

Funding

  1. NSF [CBET0652131]

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The dependence of film surface roughness and porosity on lattice size in a porous thin film deposition process is studied via kinetic Monte Carlo simulations on a triangular lattice. For sufficiently large lattice size the steady-state value of the expected film porosity has a weak dependence on the lattice size and the steady-state value of the expected surface roughness square varies linearly with lattice size. An analysis of the film morphology based on a stochastic partial differential equation description of the film surface morphology supports and explains the findings of the numerical simulations.

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