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Title
Deterministic electron ptychography at atomic resolution
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 89, Issue 6, Pages -
Publisher
American Physical Society (APS)
Online
2014-02-04
DOI
10.1103/physrevb.89.064101
References
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Related references
Note: Only part of the references are listed.- Fast deterministic single-exposure coherent diffractive imaging at sub-Ångström resolution
- (2013) A. J. Morgan et al. PHYSICAL REVIEW B
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- Atom-Scale Ptychographic Electron Diffractive Imaging of Boron Nitride Cones
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- (2012) A.M. Maiden et al. ULTRAMICROSCOPY
- Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging
- (2012) M.J. Humphry et al. Nature Communications
- High-fidelity direct coherent diffractive imaging of condensed matter
- (2011) A. J. Morgan et al. PHYSICAL REVIEW B
- Mask-assisted deterministic phase–amplitude retrieval from a single far-field intensity diffraction pattern: Two experimental proofs of principle using visible light
- (2011) Sergey G. Podorov et al. ULTRAMICROSCOPY
- Electron microscopy at a sub-50 pm resolution
- (2011) K. Takayanagi et al. Microscopy
- Electron diffractive imaging of oxygen atoms in nanocrystals at sub-ångström resolution
- (2010) Liberato De Caro et al. Nature Nanotechnology
- Electron diffractive imaging of nano-objects using a guided method with a dynamic support
- (2009) Roman Dronyak et al. APPLIED PHYSICS LETTERS
- An improved ptychographical phase retrieval algorithm for diffractive imaging
- (2009) Andrew M. Maiden et al. ULTRAMICROSCOPY
- Diffraction microscopy using 20kV electron beam for multiwall carbon nanotubes
- (2008) Osamu Kamimura et al. APPLIED PHYSICS LETTERS
- Combining Theory and Experiment in Determining the Surface Chemistry of Nanocrystals
- (2008) A. S. Barnard et al. CHEMISTRY OF MATERIALS
- Direct retrieval of a complex wave from its diffraction pattern
- (2008) A.V. Martin et al. OPTICS COMMUNICATIONS
- Phase retrieval with transverse translation diversity: a nonlinear optimization approach
- (2008) Manuel Guizar-Sicairos et al. OPTICS EXPRESS
- Direct image reconstruction from a Fourier intensity pattern using HERALDO
- (2008) Manuel Guizar-Sicairos et al. OPTICS LETTERS
- High-Resolution Scanning X-ray Diffraction Microscopy
- (2008) P. Thibault et al. SCIENCE
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