Third-dimension information retrieval from a single convergent-beam transmission electron diffraction pattern using an artificial neural network

Stacked-Bloch-wave electron diffraction simulations using GPU acceleration

(2014) Robert S. Pennington et al.   ULTRAMICROSCOPY

General framework for quantitative three-dimensional reconstruction from arbitrary detection geometries in TEM

(2013) Wouter Van den Broek et al.   PHYSICAL REVIEW B

Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methods

(2013) Florian F. Krause et al.   ULTRAMICROSCOPY

Geometric reconstruction methods for electron tomography

(2013) Andreas Alpers et al.   ULTRAMICROSCOPY

Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography

(2013) A. Béché et al.   ULTRAMICROSCOPY

Dynamic scattering theory for dark-field electron holography of 3D strain fields

(2013) Axel Lubk et al.   ULTRAMICROSCOPY

Method for Retrieval of the Three-Dimensional Object Potential by Inversion of Dynamical Electron Scattering

(2012) Wouter Van den Broek et al.   PHYSICAL REVIEW LETTERS

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

(2010) Peng Wang et al.   ULTRAMICROSCOPY

Aberration-compensated large-angle rocking-beam electron diffraction

(2010) Christoph T. Koch   ULTRAMICROSCOPY

Many-beam dynamical simulation for multilayer structures without a superlattice cell

(2009) Masahiro Ohtsuka et al.   ACTA CRYSTALLOGRAPHICA SECTION A

High-Resolution Transmission Electron Microscopy on an Absolute Contrast Scale

(2009) A. Thust   PHYSICAL REVIEW LETTERS

Computation and parametrization of the temperature dependence of Debye–Waller factors for group IV, III–V and II–VI semiconductors

(2008) M. Schowalter et al.   ACTA CRYSTALLOGRAPHICA SECTION A

Quantitative Atomic Resolution Scanning Transmission Electron Microscopy

(2008) James M. LeBeau et al.   PHYSICAL REVIEW LETTERS

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part I:

(2008) E.C. Cosgriff et al.   ULTRAMICROSCOPY

New approach for the dynamical simulation of CBED patterns in heavily strained specimens

(2007) F. Houdellier et al.   ULTRAMICROSCOPY