Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2determined by polarized x-ray spectroscopy and Seebeck measurements
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Title
Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2determined by polarized x-ray spectroscopy and Seebeck measurements
Authors
Keywords
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Journal
PHYSICAL REVIEW B
Volume 85, Issue 19, Pages -
Publisher
American Physical Society (APS)
Online
2012-05-24
DOI
10.1103/physrevb.85.195134
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