Inherent Si dangling bond defects at the thermal (110)Si/SiO2interface

Title
Inherent Si dangling bond defects at the thermal (110)Si/SiO2interface
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 84, Issue 8, Pages -
Publisher
American Physical Society (APS)
Online
2011-08-31
DOI
10.1103/physrevb.84.085329

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