High-resolution electrical detection of free induction decay and Hahn echoes in phosphorus-doped silicon

Title
High-resolution electrical detection of free induction decay and Hahn echoes in phosphorus-doped silicon
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 83, Issue 23, Pages -
Publisher
American Physical Society (APS)
Online
2011-06-01
DOI
10.1103/physrevb.83.235201

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