Journal
PHYSICAL REVIEW B
Volume 82, Issue 11, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.82.115112
Keywords
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Funding
- U.S. Department of Energy [DE-FG02-07ER46453, DE-FG02-07ER46471, DE-AC02-05CH11231]
- National Center for Electron Microscopy
- Office of Basic Energy Sciences, U.S. Department of Energy [DE-AC02-06CH11357]
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We report direct evidence of interfacial states at the onset of O K edge confined to a spatial distance of 1 unit-cell full-width at half maximum at the sharp interfaces between epitaxial films of LaMnO3 and SrMnO3 from electron energy-loss spectroscopy (EELS) measurements. The interfacial states are sensitive to interface sharpness; at rough interfaces with interfacial steps of 1-2 unit cells in height, experimental data shows a reduction, or suppression, of the interfacial states. The EELS measurements were performed using a fine electron probe obtained by electron lens aberration correction. By scanning the electron probe across the interface, we are able to map the spatial distribution of the interfacial states across interfaces at high resolution.
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