Accurate prediction of theSi/SiO2interface band offset using the self-consistentab initioDFT/LDA-1/2 method

Published 2009 View Full Article

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Title
Accurate prediction of theSi/SiO2interface band offset using the self-consistentab initioDFT/LDA-1/2 method
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 79, Issue 24, Pages -
Publisher
American Physical Society (APS)
Online
2009-06-24
DOI
10.1103/physrevb.79.241312
References
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