Phonon confinement effects in ultrathin epitaxial bismuth films on silicon studied by time-resolved electron diffraction

Title
Phonon confinement effects in ultrathin epitaxial bismuth films on silicon studied by time-resolved electron diffraction
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 80, Issue 2, Pages -
Publisher
American Physical Society (APS)
Online
2009-07-23
DOI
10.1103/physrevb.80.024307

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