Effect of amorphous interface layers on crystalline thin-film x-ray diffraction

Title
Effect of amorphous interface layers on crystalline thin-film x-ray diffraction
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 79, Issue 24, Pages -
Publisher
American Physical Society (APS)
Online
2009-06-20
DOI
10.1103/physrevb.79.245422

Ask authors/readers for more resources

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started