4.6 Article

Impact of hydrogen on indium incorporation at m-plane and c-plane In0.25Ga0.75N surfaces: First-principles calculations

Journal

PHYSICAL REVIEW B
Volume 79, Issue 4, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.79.041306

Keywords

ab initio calculations; adsorbed layers; chemical potential; gallium compounds; III-V semiconductors; indium compounds; passivation; semiconductor growth; surface structure; wetting; wide band gap semiconductors

Funding

  1. U.S. Army Research Laboratory
  2. (U.S.) Army Research Office [W911NF-08-C-0003,]

Ask authors/readers for more resources

We present first-principles calculations for m-plane and c-plane In0.25Ga0.75N surfaces. The results elucidate the dependence of indium incorporation on growth conditions. For both surfaces the calculations indicate that In incorporation is energetically favorable provided the surface is wetted by In adlayers rather than passivated by hydrogen and NH2 groups. Growth of an In0.25Ga0.75N alloy therefore requires that the chemical potential of hydrogen be kept low. The results predict that a reduction in the abundance of hydrogen can lead to greater In incorporation on the m plane as well as the c plane.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available