4.6 Article

Thickness dependence of the exchange bias in epitaxial manganite bilayers

Journal

PHYSICAL REVIEW B
Volume 79, Issue 9, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.79.094405

Keywords

antiferromagnetic materials; calcium compounds; electron energy loss spectra; exchange interactions (electron); interface magnetism; lanthanum compounds; magnetic anisotropy; magnetic epitaxial layers; magnetic hysteresis; molecular beam epitaxial growth; scanning electron microscopy; transmission electron microscopy; X-ray diffraction

Funding

  1. National Science Foundation through the University of Minnesota Materials Research Science and Engineering Center [NSF/DMR-0212032]
  2. Division of Materials Sciences and Engineering of the U. S. Department of Energy

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Exchange bias has been studied in a series of La2/3Ca1/3MnO3/La1/3Ca2/3MnO3 bilayers grown on (001) SrTiO3 substrates by ozone-assisted molecular-beam epitaxy. The high crystalline quality of the samples and interfaces has been verified using high-resolution x-ray diffractometry and Z-contrast scanning transmission electron microscopy with electron-energy-loss spectroscopy. The dependence of exchange bias on the thickness of the antiferromagnetic layer has been investigated. A critical value for the onset of the hysteresis loop shift has been determined. An antiferromagnetic anisotropy constant has been obtained by fitting the results to the generalized Meiklejohn-Bean model.

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