Journal
PHYSICAL REVIEW B
Volume 80, Issue 14, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.80.144412
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Funding
- NIST Office of Microelectronics Programs
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We have measured the temperature dependence of spin-torque-driven self-oscillations in point-contact nano-oscillators for both in-plane and out-of-plane applied fields. We find that the linewidth for both field geometries is qualitatively similar. In the absence of observable low-frequency noise, at high temperatures the linewidth decreases roughly linearly as the temperature decreases. However, extrapolation of the quasilinear region to a zero-temperature linewidth intercept can yield either a positive or negative value. This variation in the zero-temperature linewidth intercept indicates that a range of mechanisms must be involved in setting the linewidth. When 1/f noise is present in the device power spectrum, the linewidth varies quasiexponentially with temperature. While the linewidth versus temperature behavior is similar for both in-plane and out-of-plane applied fields, their output power versus current variation with temperature is qualitatively different.
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