Direct and defect-assisted electron tunneling through ultrathinSiO2layers from first principles

Published 2008 View Full Article

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Title
Direct and defect-assisted electron tunneling through ultrathinSiO2layers from first principles
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 77, Issue 19, Pages -
Publisher
American Physical Society (APS)
Online
2008-05-23
DOI
10.1103/physrevb.77.195321

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