Micrometer x-ray diffraction study ofVO2films: Separation between metal-insulator transition and structural phase transition

Published 2008 View Full Article

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Title
Micrometer x-ray diffraction study ofVO2films: Separation between metal-insulator transition and structural phase transition
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 77, Issue 23, Pages -
Publisher
American Physical Society (APS)
Online
2008-06-03
DOI
10.1103/physrevb.77.235401
References
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