Quantum transport length scales in silicon-based semiconducting nanowires: Surface roughness effects

Title
Quantum transport length scales in silicon-based semiconducting nanowires: Surface roughness effects
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 77, Issue 8, Pages -
Publisher
American Physical Society (APS)
Online
2008-02-02
DOI
10.1103/physrevb.77.085301

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now