Photoelectric probing of the interfacial trap density-of-states in ZnO nanowire field-effect transistors

Title
Photoelectric probing of the interfacial trap density-of-states in ZnO nanowire field-effect transistors
Authors
Keywords
-
Journal
PHYSICAL CHEMISTRY CHEMICAL PHYSICS
Volume 15, Issue 8, Pages 2660
Publisher
Royal Society of Chemistry (RSC)
Online
2013-01-10
DOI
10.1039/c3cp44027c

Ask authors/readers for more resources

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search