Photoelectric probing of the interfacial trap density-of-states in ZnO nanowire field-effect transistors
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Title
Photoelectric probing of the interfacial trap density-of-states in ZnO nanowire field-effect transistors
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Keywords
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Journal
PHYSICAL CHEMISTRY CHEMICAL PHYSICS
Volume 15, Issue 8, Pages 2660
Publisher
Royal Society of Chemistry (RSC)
Online
2013-01-10
DOI
10.1039/c3cp44027c
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