The relevance of interfaces for oxide ion transport in yttria stabilized zirconia (YSZ) thin films
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Title
The relevance of interfaces for oxide ion transport in yttria stabilized zirconia (YSZ) thin films
Authors
Keywords
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Journal
PHYSICAL CHEMISTRY CHEMICAL PHYSICS
Volume 15, Issue 4, Pages 1097-1107
Publisher
Royal Society of Chemistry (RSC)
Online
2012-11-20
DOI
10.1039/c2cp42347b
References
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Related references
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- Measurement of 18O tracer diffusion coefficients in thin yttria stabilized zirconia films
- (2010) M. Gerstl et al. SOLID STATE IONICS
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- Voltage-assisted 18O tracer incorporation into oxides for obtaining shallow diffusion profiles and for measuring ionic transference numbers: basic considerations
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- Elastic strain at interfaces and its influence on ionic conductivity in nanoscaled solid electrolyte thin films—theoretical considerations and experimental studies
- (2009) N. Schichtel et al. PHYSICAL CHEMISTRY CHEMICAL PHYSICS
- Response to Comment on "Colossal Ionic Conductivity at Interfaces of Epitaxial ZrO2:Y2O3/SrTiO3 Heterostructures"
- (2009) J. Garcia-Barriocanal et al. SCIENCE
- Comment on "Colossal Ionic Conductivity at Interfaces of Epitaxial ZrO2:Y2O3/SrTiO3 Heterostructures"
- (2009) X. Guo SCIENCE
- Oxygen diffusion in nanocrystalline yttria-stabilized zirconia: the effect of grain boundaries
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- Microstructures of CGO and YSZ Thin Films by Pulsed Laser Deposition
- (2007) A. Infortuna et al. ADVANCED FUNCTIONAL MATERIALS
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