Journal
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS
Volume 4, Issue 11, Pages 305-307Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/pssr.201004271
Keywords
semiconductors; chemical vapour deposition; silicon carbide; epitaxy
Funding
- Swedish Research Council (VR)
- Swedish Energy Agency
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The heteroepitaxial growth of 3C-SiC on 6H-SiC(0001) on-axis substrates is demonstrated in this study. A hot-wall CVD reactor working at a reduced pressure was used to perform growth experiments at temperatures between 1300 degrees C and 1500 degrees C. The addition of hydrogen chloride to standard precursors allowed a wide window of operating parameters, which resulted in the growth of very high quality and purity 3C-SiC layers, with a morphology characterized largely by single-domains, especially when nitrogen was intentionally added. Growth rate of 10 mu m/h and n-type background doping in the low 10(15) cm(-3) range were achieved. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
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