Application of capacitance-voltage measurements to the determination of interface roughness in nanoparticulate field-effect transistors

Published 2010 View Full Article

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Title
Application of capacitance-voltage measurements to the determination of interface roughness in nanoparticulate field-effect transistors
Authors
Keywords
-
Journal
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
Volume 207, Issue 7, Pages 1672-1676
Publisher
Wiley
Online
2010-06-10
DOI
10.1002/pssa.200983737

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