Accurate electrostatic and van der Waals pull-in prediction for fully clamped nano/micro-beams using linear universal graphs of pull-in instability

Published 2014 View Full Article

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Title
Accurate electrostatic and van der Waals pull-in prediction for fully clamped nano/micro-beams using linear universal graphs of pull-in instability
Authors
Keywords
-
Journal
PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES
Volume 63, Issue -, Pages 151-159
Publisher
Elsevier BV
Online
2014-06-02
DOI
10.1016/j.physe.2014.05.023

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