Journal
PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES
Volume 43, Issue 1, Pages 547-551Publisher
ELSEVIER
DOI: 10.1016/j.physe.2010.09.013
Keywords
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Funding
- GIK Institute of Engineering Sciences and Technology
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Thin films of organic semiconductor copper phthalocyanine (CuPc) and Al were deposited in sequence by vacuum evaporation on a glass substrate with Ag source and drain electrodes. The effect of pressure on the properties of the fabricated field effect transistor (FET) with metal (aluminum) - semiconductor (copper phthalocyanine) Schottky junction was investigated. It was observed that the drain-source resistance of this organic field effect transistor (OFET) decreased with pressure. (C) 2010 Elsevier B.V. All rights reserved.
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