Demonstration of gating action in atomically controlled Si:P nanodots defined by scanning probe microscopy

Title
Demonstration of gating action in atomically controlled Si:P nanodots defined by scanning probe microscopy
Authors
Keywords
-
Journal
PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES
Volume 40, Issue 5, Pages 1006-1009
Publisher
Elsevier BV
Online
2007-09-11
DOI
10.1016/j.physe.2007.08.057

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