4.4 Article

Aberration corrected Lorentz scanning transmission electron microscopy

Journal

ULTRAMICROSCOPY
Volume 152, Issue -, Pages 57-62

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2015.01.003

Keywords

Lorentz microscopy; Aberration correction; Magnetic thin films; Differential phase contrast

Categories

Funding

  1. Scottish Universities Physics Alliance (SUPA)
  2. University of Glasgow and Seagate
  3. Engineering and Physical Sciences Research Council [EP/I013520/1, 1096299, EP/I00419X/1] Funding Source: researchfish
  4. EPSRC [EP/I013520/1, EP/I00419X/1] Funding Source: UKRI

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We present results from an aberration corrected scanning transmission electron microscope which has been customised for high resolution quantitative Lorentz microscopy with the sample located in a magnetic field free or low field environment. We discuss the innovations in microscope instrumentation and additional hardware that underpin the imaging improvements in resolution and detection with a focus on developments in differential phase contrast microscopy. Examples from materials possessing nanometre scale variations in magnetisation illustrate the potential for aberration corrected Lorentz imaging as a tool to further our understanding of magnetism on this lengthscale. (C) 2015 Elsevier B.V. All rights reserved.

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