Large-angle illumination STEM: Toward three-dimensional atom-by-atom imaging

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Title
Large-angle illumination STEM: Toward three-dimensional atom-by-atom imaging
Authors
Keywords
Scanning transmission electron microscopy (STEM), Annular dark-field (ADF), Atomic-depth resolution imaging, Surface imaging
Journal
ULTRAMICROSCOPY
Volume 151, Issue -, Pages 122-129
Publisher
Elsevier BV
Online
2014-11-26
DOI
10.1016/j.ultramic.2014.11.009

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