The influence of C s / C c correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy

Published 2015 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
The influence of C s / C c correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy
Authors
Keywords
Aberration correction, HREM, Phase contrast, Amplitude contrast, ETEM, EFTEM, AEM, EELS, XEDS, In-situ, Tomography
Journal
ULTRAMICROSCOPY
Volume 151, Issue -, Pages 240-249
Publisher
Elsevier BV
Online
2014-11-12
DOI
10.1016/j.ultramic.2014.09.012

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.