Characterization of major in-grown stacking faults in 4H-SiC epilayers

Published 2009 View Full Article

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Title
Characterization of major in-grown stacking faults in 4H-SiC epilayers
Authors
Keywords
-
Journal
PHYSICA B-CONDENSED MATTER
Volume 404, Issue 23-24, Pages 4745-4748
Publisher
Elsevier BV
Online
2009-09-02
DOI
10.1016/j.physb.2009.08.189

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