Journal
PHOTONICS AND NANOSTRUCTURES-FUNDAMENTALS AND APPLICATIONS
Volume 6, Issue 1, Pages 81-86Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.photonics.2007.10.002
Keywords
photonic crystal; emissivity; measurements; high temperature
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An accurate methodology is presented to measure photonic crystal emissivity using a direct method. This method addresses the issue of how to separate the emissions from the photonic crystal and the substrate. The method requires measuring two quantities: the total emissivity of the photonic crystal-substrate system, and the emissivity of the substrate alone. Our measurements have an uncertainty of 4% and represent the most accurate measure of a photonic crystal's emissivity. The measured results are compared to, and agree very well with, the independent emitter model. (c) 2007 Elsevier B.V. All rights reserved.
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