Revealing the transient states of rapid solidification in aluminum thin films using ultrafastin situtransmission electron microscopy

Quantifying transient states in materials with the dynamic transmission electron microscope

(2010) G. H. Campbell et al.   Microscopy

Solving the accelerator-condenser coupling problem in a nanosecond dynamic transmission electron microscope

(2010) B. W. Reed et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Pattern size dependence of grain growth in Cu interconnects

(2010) Stefan Brandstetter et al.   SCRIPTA MATERIALIA

Four-zone solidification microstructure formed by laser melting of copper thin films

(2009) R. Zhong et al.   APPLIED SURFACE SCIENCE

The Evolution of Ultrafast Electron Microscope Instrumentation

(2009) B.W. Reed et al.   MICROSCOPY AND MICROANALYSIS

Electron microscopy of geometrically confined copper thin films after rapid lateral solidification

(2008) A. Kulovits et al.   THIN SOLID FILMS

Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM)

(2008) Thomas LaGrange et al.   ULTRAMICROSCOPY