Journal
PHILOSOPHICAL MAGAZINE
Volume 92, Issue 25-27, Pages 3243-3256Publisher
TAYLOR & FRANCIS LTD
DOI: 10.1080/14786435.2012.693215
Keywords
size effect; copper; tensile testing; Hall-Petch behavior; micromechanics
Categories
Funding
- K2 Competence Centre
Ask authors/readers for more resources
Polycrystalline copper wires with diameters of 25, 30 and 50 mm were annealed at temperatures between 200 degrees C and 900 degrees C, resulting in different microstructures with ratios of wire diameter to grain size between 1.1 and 15.6. The microstructure evolution and tensile behavior were studied systematically. In comparison with experimental data available in the literature, the results revealed that the tensile yield stresses of these micro-sized wires are influenced not only by the grain size but also by the ratio of wire diameter to grain size. This is clearly seen when comparing identical grain sizes but different wire diameters where thinner wires reveal smaller flow stress values. A model is proposed to explain the 'smaller is softer' phenomenon, taking into account the higher strengthening effect of grain boundaries compared to the free surface.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available