Residual stress measurement at the micrometer scale: focused ion beam (FIB) milling and nanoindentation testing

Published 2010 View Full Article

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Title
Residual stress measurement at the micrometer scale: focused ion beam (FIB) milling and nanoindentation testing
Authors
Keywords
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Journal
PHILOSOPHICAL MAGAZINE
Volume 91, Issue 7-9, Pages 1121-1136
Publisher
Informa UK Limited
Online
2010-05-31
DOI
10.1080/14786431003800883
References
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