Journal
PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION
Volume 25, Issue 4, Pages 293-297Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/ppsc.200800027
Keywords
image analysis; particle shape; three-dimensional reconstruction
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A system for simultaneous three-dimensional measurement of particle shape has been developed. The system is based on a free-fall analysis. Free-failing particles are captured from three orthogonal directions and reconstructed in the three-dimensional sense. The three-dimensional information can be used for particle characterization as well as for simulations of particle behavior.
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