Correcting for contact geometry in Seebeck coefficient measurements of thin film devices

Published 2014 View Full Article

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Title
Correcting for contact geometry in Seebeck coefficient measurements of thin film devices
Authors
Keywords
-
Journal
ORGANIC ELECTRONICS
Volume 15, Issue 10, Pages 2250-2255
Publisher
Elsevier BV
Online
2014-07-05
DOI
10.1016/j.orgel.2014.06.018

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