Journal
ORGANIC ELECTRONICS
Volume 15, Issue 11, Pages 2749-2755Publisher
ELSEVIER
DOI: 10.1016/j.orgel.2014.07.010
Keywords
Electron mobility; C-60; Organic thin film transistor; Highly sensitive ultraviolet photoelectron spectroscopy; Grazing incidence X-ray diffraction
Funding
- Global-COE Program of MEXT (Advanced School for Organic Electronics, Chiba University) [G03]
- KAKENHI (JSPS) [24245034, 23360005]
- joint JSPS-NSFC Project [612111116]
- National Natural Science Foundation of China [61274019, 51033007]
- Studienstiftung des Deutschen Volkes
- Grants-in-Aid for Scientific Research [26248062, 23360005] Funding Source: KAKEN
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C-60-based organic thin film transistors (OTFTs) with high electron mobility and high operational stability are achieved with (1 1 1) oriented C-60 films grown by using template effects of diindenoperylene (DIP) under layer on the SiO2 gate insulator. The electron mobility of the C60 transistor is significantly increased from 0.21 cm(2) V-1 s(-1) to 2.92 cm(2) V-1 S-1 by inserting the template-DIP layer. Moreover much higher operational stability is also observed for the DIP-template C-60 OTFTs. A grazing incidence X-ray diffraction and ultra-high-sensitivity photoelectron spectroscopy measurements indicate that the improved electron mobility and stability arise from the decreased density of trap states in the C-60 film due to increased (1 1 1) orientation of C-60-grains and their crystallinity on the DIP template. (C) 2014 Elsevier B.V. All rights reserved.
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