Electric potential mapping by thickness variation: A new method for model-free mobility determination in organic semiconductor thin films

Published 2013 View Full Article

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Title
Electric potential mapping by thickness variation: A new method for model-free mobility determination in organic semiconductor thin films
Authors
Keywords
-
Journal
ORGANIC ELECTRONICS
Volume 14, Issue 12, Pages 3460-3471
Publisher
Elsevier BV
Online
2013-09-27
DOI
10.1016/j.orgel.2013.09.021

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