Journal
ORGANIC ELECTRONICS
Volume 13, Issue 9, Pages 1583-1588Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.orgel.2012.05.008
Keywords
Contact resistance; Double-gate; Pentacene; Organic field-effect transistors
Funding
- New Energy and Industrial Technology Development Organization (NEDO), Japan [11B11016d]
- Ministry of Education, Culture, Sport, Science and Technology of Japan [218505]
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A study of the contact resistance (R-sd) in pentacene-based double-gate transistors is presented. In top-contact transistors, as the negative bias of the additional top-gate bias is increased, R-sd decreases by over five orders of magnitude for small bottom-gate voltages. In bottom-contact transistors, R-sd is reduced by about ten times for all bias values, implying improved charge transport in all operating regimes. The different tunability of R-sd in top/ bottom-contact transistors is attributed to different charge injection modulation by thecoplanar/staggered top gate. Therefore, double-gate architecture offers a novel and effective approach to limit R-sd and its relevant impacts on organic transistor. (C) 2012 Elsevier B. V. All rights reserved.
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